Optoelectronics

x-InGaAs line sensor targets SWIR spectroscopy

24th April 2015
Siobhan O'Gorman
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An x-InGaAs line sensor for SWIR spectroscopy has been introduced by LASER COMPONENTS. The IG22X0103L28-256TEC array features 256 pixels measuring 30x250x50µm, with a typical 20% cut off wavelength of 2.2µm at -40˚C.

As dark current is a function of the bias voltage, voltage-free operation is ideal; realistically, the input offset of the amplifier often acts as bias voltage. In the IG22 array, this undesired voltage is reset to zero after each readout.

The amplification can be finely adjusted at eight levels, individually per pixel. This is practical because the middle of the line is often illuminated more strongly than its edges. Thus, the optimal dynamic range per pixel can be utilised.

This array, which is equipped with a two-stage Peltier element, achieves a dT of 65K, and can be cooled from room temperature to -40°C. An anti-alias low-pass filter is integrated before the sample-and-hold circuit.
Furthermore, this array is equipped with all commercial standard features, such as correlated double sampling. Complete evaluation electronics are available with a USB interface.

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