Optoelectronics

Light interferometry ensures high quality optics

10th March 2015
Siobhan O'Gorman
0

To provide high quality laser optics, LASER COMPONENTS uses a white light interferometer to measure the three-dimensional structure of a surface. This is a non-contact optical method which uses the interference of broadband light to measure substrate surfaces. The measurement accuracy is less than 0.1nm for vertical resolution.

Substrates produced both internally and externally can be tested using this technology. Generally, LASER COMPONENTS randomly selects substrates for routine measurements, however, testing can be carried out on request.

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