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Benchtop based IR thermal test system for live testing

Benchtop based IR thermal test system for live testing
A benchtop based PDR IR-TS One IR Thermal Test System has been introduced by PDR, designed to thermally cycle key critical components and assemblies to detect defects. Using PDR’s Non-Destructive Dual Thermal Stress Screening Process, based on a variation on HALT/HASS principles, the system is able to focus the testing on suspected problem areas to safely screen out early field failures caused by design, environmental, production and structural defects.
21st June 2017


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SPIE Photonics Europe 2018
22nd April 2018
France Strasbourg