Tektronix

Address:
14150 SW Karl Braun Drive
P.O. Box 500
Beaverton

OR 97077
United States of America

Phone: 503-260-1169

Web: www.tek.com


Tektronix articles

Displaying 1 - 9 of 9

Single carrier wireless link travels at 100Gb/s data rate

Single carrier wireless link travels at 100Gb/s data rate
A single carrier wireless link travelling at a 100 Gb/s data rate has been demonstrated by Tektronix and IEMN, a major French research laboratory. This demonstration uses advanced data coding, THz photonics and wideband and linear devices to enable ultra-fast wireless connections in the 252 - 325GHz band per the recently published IEEE 802.15.3d standard.
16th May 2018

Optical probe overcomes 400G PAM4 debug challenges

Optical probe overcomes 400G PAM4 debug challenges
A 56GBd 400G PAM4 optical probe has been introduced for use with the Tektronix DPO70000SX Series real-time oscilloscopes. The 59 GHz DPO7OE2 single mode optical probe delivers the performance and advanced debug capabilities designers need to troubleshoot 400G PAM4 components and reduce time to market.
14th March 2018

Optical modules lift 400G yields

Two optical modules have been introduced by Tektronix for its DSA8300 sampling oscilloscope that offer high sensitivity and low noise, enabling manufacturers to increase production capacity and improve yields for 400G designs moving into production.
14th March 2018


ECOC display addresses 400G test challenges

ECOC display addresses 400G test challenges
The latest in optical test innovation for data centre networking will be showcased by Tektronix at ECOC 2017 in Gothenburg (18-20 September). Tektronix will bring back its Open Technology Forum again this year as part of its stand, hosting industry experts from leading research and commercial companies to discuss the trends and opportunities for emerging optical communications designs.
26th July 2017

Optical modules boast high sensitivity, lowest noise

Optical modules boast high sensitivity, lowest noise
New optical modules for its DSA8300 sampling oscilloscope have been announced by Tektronix. The modules feature high mask test sensitivity and lowest noise along with new features that increase production capacity and improve yield for current 100G designs moving into production.
21st March 2017

Optical test solutions head for Los Angeles

Optical test solutions head for Los Angeles
The latest in optical test innovation for data centre networking will be showcased by Tektronix at OFC 2017 in Los Angeles (March 19-23). Data centre networking technology providers are looking to continuously increase the capacity and precision of high speed data transfers.
6th March 2017

Tektronix enhances Optical Modulation Analyser Software

Tektronix enhances Optical Modulation Analyser Software
Tektronix announced a series of enhancements to its optical modulation analyser (OMA) software. The latest release provides optical research engineers with the ability to evaluate multi-channel coherent modulation schemes with confidence using a single measurement system. Engineers can now calibrate and control multiple OMA’s to easily acquire and analyse simultaneous data from multiple channels such as different wavelengths or fiber cores.
19th September 2016

70GHz oscilloscope takes centre stage at ECOC 2016

70GHz oscilloscope takes centre stage at ECOC 2016
A wide range of optical test and measurement products and solutions will be showcased by Tektronix at ECOC 2016 in Dusseldorf (September 19-21).  The copany is reprising its Open Technology Forum, hosting industry experts from leading research and commercial companies to discuss the trends and opportunities for emerging optical communications designs.
13th July 2016

Tektronix Showcases New and Enhanced Optical Test Solutions at ECOC 2013

Tektronix announced today that the company will be showcasing a wide-range of optical test and measurement products at ECOC 2013 (Stand 638, Hall N8-N10), which takes place from 23.-25.09.2013 in London, UK. The Tektronix products on display will address a wide range of applications, from multi-channel pattern generation and multi-channel BERT testing to coherent lightwave signal analysis and testing of the world’s most complex components; visitors to the Tektronix stand will be able to get hands-on demonstrations and technical advice to help them solve their individual test and measurement challenges. On hand will be the new AWG70000 series arbitrary waveform generator that offers the industry’s best combination of high sample rate, long waveform memory and deep dynamic range.
11th June 2013


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