Test & Measurement

Displaying 161 - 170 of 186

Ocean Optics Adds New Triggering and Interface Options for Maya2000 Pro Spectrometer

Ocean Optics Adds New Triggering and Interface Options for Maya2000 Pro Spectrometer
Ocean Optics has added triggering functions to its Maya2000 Pro back-thinned CCD miniature spectrometer to provide accurate timing and synchronization between the spectrometer and other devices. Three low-jitter trigger and normal operating modes are now possible. Applications include pulsing a light source to occur when acquiring a spectra and synchronizing spectral acquisition to coordinate with samples moving through a process stream or sensors reaching a certain temperature level.
6th January 2012

Ocean Optics Probe Improves pH Response

Ocean Optics’ new R1000-4 reflection probe maximizes efficiency of pH measurement. Paired with Ocean Optics’ non-intrusive reflective pH sensing patches, the R1000-4 overcomes the shortcomings of alternative pH measurements methods to deliver accurate pH response in turbid or colored environments.
6th January 2012

Maximum Detection Efficiency for Photon Counters

Maximum Detection Efficiency for Photon Counters
In applications in which single photons must be detected, such as in spectroscopy, confocal or Stimulated Emission Depletion (STED) microscopy, single molecule detection, and quantum cryptography, it is not only important to achieve an extremely low dark count rate of the detector, but a detection efficiency that is as high as possible. Each percent counts. Depending on the version, the COUNT modules exhibit efficiencies of >80% at 670nm and >50% at 405nm.
6th January 2012


FIBERCHECK and Adaptor

FIBERCHECK and Adaptor
LASER COMPONENTS‘ FIBERCHECK is an inexpensive test device used to test optical fibres for damage. Fibre fractures and defects can be quickly and reliably located in the field, in both single-mode and multi-mode fibres. Additionally, the FIBRECHECK can be used to quickly locate a specific fibre amongst many, for example, in a fibre loom or bundle
5th January 2012

Luna Innovations Introduces New Sensing Platform, the ODiSI Series, Enabling High Resolution Strain or Temperature Measurements

Luna Innovations Incorporated has announced the launch of the ODiSI (Optical Distributed Sensor Interrogator) instrument, the new sensing platform which will be marketed and sold under the company's test and measurement equipment brand name Luna Technologies. The new sensing product provides fully distributed strain or temperature measurements, delivering an unprecedented amount of data by using optical fiber as a continuous sensor.
12th December 2011

Micron Optics New Optical Displacement Sensor Offers Unique Measurement Capabilities

Micron Optics, Inc. has announced the new product release of the os5100 Displacement Gage. This fiber optic displacement gage addresses needs for long term monitoring of relative displacement up to 50 millimeters between two anchor points. Like all Micron Optics optical sensors, the os5100 displacement gage is immune to electromagnetic noise environments and offers reliable performance even under harsh environmental conditions.
12th December 2011

Altatech Semiconductor Enters LED Inspection Market with AltaSight LEDMax System

Altatech Semiconductor S.A. has entered the light-emitting diode (LED) inspection market by introducing its new AltaSight LEDMax system, the company’s first product designed specifically for detecting, classifying and characterizing defects on wafers used in manufacturing LEDs.
12th December 2011

New OSICS Module: Variable Backreflector

Yenista Optics has further expanded its multi-channel OSICS platform with a new Variable Backreflector module. The “OSICS BKR” module provides a controllable back reflection of up to 55dB over the 1250nm to 1650nm wavelength range.
9th December 2011

ZeScope Optical Profiler Combines 3D Surface Metrology with Ease of Use

ZeScope Optical Profiler Combines 3D Surface Metrology with Ease of Use
Zemetrics introduces ZeScope, a sub-nanometer precision 3D optical profilometer for general and industrial applications. The newly developed metrology system is distinctive in offering high resolution imaging along with numerous motorized and automated ease-of-use features in a high-value standard product.
5th December 2011

ULVAC Introduces the UNECS-2000, UNECS-3000A spectroscopic ellipsometer

ULVAC Technologies, Inc. has introduced the UNECS-2000 spectroscopic ellipsometer for the high speed measurement of film thickness and optical constants of thin films and the UNECS-3000A for automated 300 mm substrate measurements.
5th December 2011


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