Test & Measurement

Displaying 191 - 200 of 206

The Hiden 3FD Fast-response Mass Spectrometer

The 3F-series of quadrupole mass spectrometers from Hiden Analytical now feature direct digital signal detection for our fastest response and most sensitive detection levels, addressing the needs of the researcher operating in the UHV/XHV vacuum regime through to specialised fast-event gaseous studies at pressures to atmosphere and beyond.
28th November 2011

Micron Optics Introduces New Optical Sensing Module for Ultra-high Speed Applications

Micron Optics, Inc. is proud to announce the sm690, a new ultra-high speed, high resolution data acquisition module capable of simultaneously measuring up to four Fiber Bragg Gratings (FBGs) at a 2MHz sampling frequency, a rate which is currently unparalleled in the optical sensing industry.
18th November 2011

Hamamatsu develops instrument for terahertz ATR spectroscopy

Hamamatsu develops instrument for terahertz ATR spectroscopy
Hamamatsu Photonics K.K. has long been studying terahertz technologies as a part of the pursuit of opto-electronics possibilities. As a result, Hamamatsu has developed an instrument for terahertz ATR (attenuated total reflection) spectroscopy that features our original ATR component, in which the terahertz emitter and detector are combined in one piece with the ATR prism.
11th November 2011


Small Spot Film Thickness, UV Microscopy and Raman Microspectroscopy of Large Scale Devices- The 20/20 XL from CRAIC Technologies

Small Spot Film Thickness, UV Microscopy and Raman Microspectroscopy of Large Scale Devices- The 20/20 XL from CRAIC Technologies
The 20/20 XL is designed to work with large scale samples, such as 300 mm wafers, to measure thin film thickness as well as the Raman spectra of microscopic sampling areas. The 20/20 XL also offers UV microscopy, a full spectroscopy suite as well as either manual or automated operation. Because of the flexible instrument design, the is no upper limit to the sample size which makes this instrument perfect for everything from quality control of the largest flat panel displays to film thickness of 300 mm wafers.
4th November 2011

Cree Launches Industry-Leading TEMPO Evaluation Services Furthering Commitment to Success of LED Lighting Manufacturers

Cree Launches Industry-Leading TEMPO Evaluation Services Furthering Commitment to Success of LED Lighting Manufacturers
Cree, Inc. announces the commercial availability of TEMPO Services, a comprehensive set of quantitative and qualitative tests and analyses for LED-based lighting fixtures and lamps. TEMPO (Thermal, Electrical, Mechanical, Photometric and Optical) Services represent the accumulated advantage of Cree’s extensive experience with customer LED systems combined with the use of calibrated test equipment to give LED lighting manufacturers and end users confidence in LED product designs.
7th October 2011

920XC Hand-held Single-mode OTDR from Laser Components

The new Greenlee series 920XC OTDR (Optical Time Domain Reflectometer) hand-helds by Tempo are fully equipped measuring devices for the inspection of optical fibers and optical fiber systems and for the localization of defects in fiber paths.
3rd October 2011

LM-79 Luminaire Testing form Orb Optronix

Orb Optronix' LM-79 luminare testing fully evaluates the assembled luminaire for total flux, electrical power, efficacy (lm/watt), chromaticity, and angular distribution of light. The laboratory specializes in the measurement of Solid State Lighting lamps per IES standards including LM-79. Orb has participated in several rounds of CALiPER LM-79 Testing, LM-79 Testing for ENERGY STAR® for SSL, and is accredited to provide test and measurement under ISO 17025.
3rd October 2011

B&W Tek Announces Enhanced High Resolution Raman Spectrometer, and New State of the Art Chemometric Software

B&W Tek, Inc. has recently enhanced the industry leading i-Raman® high resolution TE cooled Raman spectrometer as well as introduced a state of the art chemometric software package, BWIQ™. The i-Raman® is equipped with B&W Tek’s patented CleanLaze® technology for exceptional laser stabilization and narrow linewidth. Other features include a spectral resolution as fine as 3cm-1, wide Raman shift coverage up to 4000cm-1, and a TE cooled 2048 pixel CCD array.
12th September 2011

AOI: Agile Optical Inspection

We sounded out one company on how it has adopted AOI to achieve the inspection resource it needed.
31st August 2011

Hamamatsu Photonics Photo Back Illuminated 16 Channel Photodiode Array

Hamamatsu Photonics introduce a brand new, back illuminated 16 channel photodiode array (PDA), designed for use in X-ray non-destructive testing applications.
4th August 2011


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