High resolution beam profiling camera with GigE interface

31st July 2018
Posted By : Alex Lynn
High resolution beam profiling camera with GigE interface

It has been announced that MKS Instruments is introducing the new Ophir SP920G GigE Silicon CCD High Resolution Camera designed specifically for industrial laser beam profiling applications. The camera accurately captures and analyses wavelengths from 190 to 1,100nm.

It also features a compact design, wide dynamic range, unparallelled signal to noise ratio, and high-speed Gigabit Ethernet interface. The SP920G is suited for measuring CW and pulsed laser profiles in such high speed applications as laser cutting of medical devices or welding of dissimilar materials.

The new SP920G beam profiling camera includes a high speed GigE interface, allowing it to leverage the benefits of higher speed combined with industry standard Ethernet's ready availability, broad compatibility, and lower cost. The camera delivers 1624x1224px resolution with a 4.4µm pixel pitch for measuring beam widths of 44μm to 5.3mm. It also includes a photodiode synch to capture scattered laser light at even the most challenging nanosecond pulse rates.

Reuven Silverman, General Manager at Ophir, stated: "The Ophir SP920G combines the advantages of a high resolution CCD camera with an excellent signal to noise ratio and the flexibility and speed of a GigE interface. The GigE interface allows the camera to be used over larger distances from the laser to the PC, enabling beam measurement that could, due to safety or spatial concerns, not be possible via USB interfaces. The speed and flexibility also simplify OEM applications in manufacturing and plant engineering, reinforcing Ophir's commitment to bringing world-class solutions to the industrial market.”

The SP920G GigE CCD camera is supported by BeamGage, the industry's most advanced beam analysis software. BeamGage Standard includes all the algorithms and calculations needed to make accurate, ISO approved laser beam measurements. The software provides advanced image processing features, NIST-traceable power measurements, trend charting, data logging, pass/fail production testing, and multilingual support for English, Japanese, and Chinese.

BeamGage Professional adds such capabilities as partitioning of the camera output for separate analysis of multiple laser beams from sources such as fibre, a .NET interface for full remote control when integrating beam analysis into an automated application, and camera sharing.

The Ophir SP920G GigE Silicon CCD beam profiling camera is available now.


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